Retraction Note to: A saboteur and mutant based built-in self-test and counting threshold-based built-in self repairing mechanism for memories
نویسندگان
چکیده
منابع مشابه
Built-In Self Test
BIST is a technique aimed to: Avoiding the usage of expensive ATE Increase the fault tolerance since it add more access to the internal points Allow the application of at-speed test and reduce the test time. It is mandatory to consider the BIST as a test solution when the design flow and the design area can afford it.
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The testability of cryptographic cores brings in an extra dimension to the process of digital circuits testing – security. The benefits of the classical methods such as the scan-chain method introduce new vulnerabilities concerning data protection. A Built-In Self-Test (BIST) approach is considered to be the most suitable countermeasure for this purpose. In this work we propose re-using a multi...
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ژورنال
عنوان ژورنال: Journal of Ambient Intelligence and Humanized Computing
سال: 2022
ISSN: ['1868-5137', '1868-5145']
DOI: https://doi.org/10.1007/s12652-022-04295-w